An Innovative Inspection and Metrology Solutions Provider
New Product Release: iSurfaceProfiler Metrology Instruments
January 20, 2014
Austin, Texas - Applied Electro-Optics Inc. (AEO), a leading supplier of automated macro defect inspection systems, video measuring systems and image processing software products, today announced the release of a new product: iSurfaceProfiler, an automated surface topography measurement system using the white light axial chromatism sensor technology. The instruments can be used in the measurement of surface profile, roughness, transparent film thickness, coating and paint uniformity. A high magnification microscope is integrated into the system as a standard option, users can review the surface topography or irregularities in the same system. Also as an option an AFM module is available.