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iDefectFinder-IR Shipped to Global Leader in Healthcare Technology for CZT Wafer Inspection
February 25, 2013
Austin, Texas - Applied Electro-Optics Inc. (AEO), a leading supplier of automated macro defect inspection systems, video measuring systems and image processing software products, today announced the release of a new product: iDefectFinder-IR, an automatic infrared defect inspection system. And the first system has been shipped to a global leader in healthcare technology with operations in Israel. The iDefectFinder-IR system will be used to detect grain boundaries, surface defects such as scratches, pits and residue as well as embedded defects such as micro pipes and inclusions of CZT wafers.